Agilent News - Test and Measurement
Agilent test and measurement press releases, feature stories, business briefs and more.
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- Press Release: Agilent Technologies, picoChip, mimoOn Demonstrate 3GPP LTE Femtocell Testing Capability
Tue, 22 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies Introduces First One-Box Test Solution for Multicarrier Performance Test of Release B-Capable Devices
Mon, 21 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies Announces 5.7 Mbps HSUPA Data Analysis for Testing Category 6, HSUPA-Capable Mobile Devices, Chipsets
Mon, 21 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies' LTE Test Solutions Now Compliant with March 2008 LTE Standard
Mon, 21 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies Announces Industry's First HiSIM2.4 Model Extraction Package for DC, RF Parameters
New IC-CAP Software Package Offers Improved CMOS Modeling Efficiency, Accuracy
Mon, 14 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies Introduces Low-Cost DC Power Supplies with Features Typical of Costly Models
Mon, 07 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies' New X-Series Measurement Application Automates LTE Measurements
Tue, 01 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies Introduces Most Reliable Link Test Solution for OBSAI Standard Interconnects
Tue, 01 Jul 2008 08:00:00 PST - Press Release: Agilent Technologies' GoldenGate Simulator Chosen by Renesas Technology to Expand its RF Design Environment
Renesas Also Selected New LTE Library for Advanced Design System
Wed, 25 Jun 2008 08:00:00 PST - Press Release: Agilent Technologies Representative Re-elected to PCI-SIG(r) Board of Directors
Tue, 24 Jun 2008 08:00:00 PST - For more Agilent News, visit the News@Agilent Web site
Sun, 01 Jan 2006 08:00:00 PDT
